May 08, 2024  
2016-2017 University Catalog 
    
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2016-2017 University Catalog [ARCHIVED CATALOG]

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ECE 65800 - Semiconductor Material And Device Characterization

Credit Hours: 3.00. A comprehensive survey of modern characterization techniques routinely used to determine solid-state material and device parameters. Concepts and theory underlying the techniques are examined, and sample experimental results are presented. The coverage includes electrical, optical, chemical, and physical characterization methods. Offered in alternate years. Prerequisite: ECE 60600 . Typically offered Spring.


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