ECE 40700 - Semiconductor Measurements Laboratory

Credit Hours: 1.00. Experiments incorporating state-of-the-art equipment and measurement techniques are performed to collect electrical characteristics exhibited by a representative set of semiconductor devices including the pn-junction diode, Schottky diode, photo devices (solar cell, photo detectors, LEDs), BJTs, the MOS-Capacitor, MOSFETs, and special resistor-like structures. The devices are subjected to d.c., a.c., and pulse biastry, magnetic fields, optical excitation, and/or temperature ranging. The measured characteristics are subsequently used to deduce information about the internal nature and/or operation of semiconductor devices. Typically offered Fall Spring.

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ECE 40700 - Semiconductor Measurements Laboratory